SFFS053 December 2021 TPS272C45
The failure mode distribution estimation for TPS272C45 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.
Die Failure Modes | Failure Mode Distribution (%) |
---|---|
OUT1, 2 open (HiZ) | 20% |
OUT1, 2 stuck ON to VS | 10% |
OUT1, 2 not in specification voltage or timing | 50% |
Diagnostics not in specification | 10% |
Protection function fails to trip | 10% |