SFFS163 May 2021 DRV8871-Q1
The failure mode distribution estimation for DRV8871-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.
Die Failure Modes | Failure Mode Distribution (%) |
---|---|
OUTx is stuck low when commanded OFF | 16% |
OUTx is stuck OFF when commanded LOW | 10% |
OUTx ON resistance too high when commanded LOW | 14% |
OUTx is stuck HIGH when commanded OFF | 16% |
OUTx is stuck OFF when commanded HIGH | 10% |
OUTx ON resistance too high when commanded HIGH | 19% |
Dead-time is too short | 1% |
ITRIP current regulation incorrect | 4% |
Incorrect fault response | 10% |