SFFS307 November   2021 LM5123-Q1

 

  1.   Trademarks
  2. 1Overview
  3. 2Functional Safety Failure In Time (FIT) Rates
  4. 3Failure Mode Distribution (FMD)
  5. 4Pin Failure Mode Analysis (Pin FMA)

3 Failure Mode Distribution (FMD)

The failure mode distribution estimation for the LM5123-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity, and from best engineering judgment.

The failure modes listed in this section reflect random failure events and do not include failures resulting from misuse or overstress.

Table 3-1 Die Failure Modes and Distribution
Die Failure ModesFailure Mode Distribution (%)
HO or LO gate driver stuck on10
HO or LO gate driver stuck off20
HO or LO gate driver open (high-Z)5
VOUT voltage not in specification30
PGOOD false trip or fails to trip35