SFFS341 February 2022 LM5163
This section provides a Failure Mode Analysis (FMA) for the pins of the LM5163. The failure modes covered in this document include the typical pin-by-pin failure scenarios:
Table 4-2 through Table 4-5 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.
Class | Failure Effects |
---|---|
A | Potential device damage that affects functionality |
B | No device damage, but loss of functionality |
C | No device damage, but performance degradation |
D | No device damage, no impact to functionality or performance |
Figure 4-1 shows the LM5163 pin diagram. For a detailed description of the device pins please refer to the Pin Configuration and Functions section in the LM5163 data sheet.
Following are the assumptions of use and the device configuration assumed for the pin FMA in this section:
Pin Name | Pin No | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
GND | 1 | D | |
VIN | 2 | VOUT = 0 V | B |
EN/UVLO | 3 | VOUT = 0 V | B |
RON | 4 | VOUT unregulated; 0 ≤ VOUT < set voltage | B |
FB | 5 | VOUT >> set voltage. PGOOD can become damaged if VIN > 14 V. | A |
PGOOD | 6 | PGOOD is invalid flag. | B |
BST | 7 | VOUT = 0 V | B |
SW | 8 | Power FET damage | A |
Pin Name | Pin No | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
GND | 1 | VOUT = 0 V | B |
VIN | 2 | VOUT = 0 V | B |
EN/UVLO | 3 | VOUT = 0 V | B |
RON | 4 | VOUT > set voltage | B |
FB | 5 | VOUT >> set voltage. PGOOD can become damaged if VIN > 14 V. | A |
PGOOD | 6 | PGOOD flag invalid | B |
BST | 7 | VOUT = 0 V | B |
SW | 8 | VOUT = 0 V | B |
Pin Name | Pin No | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
GND | 1 | VOUT = 0 V | B |
VIN | 2 | D | |
EN/UVLO | 3 | VIN > 5.5 V can lead to device damage. | A |
RON | 4 | VOUT < set voltage | B |
FB | 5 | PGOOD flag invalid. VOUT can be unregulated. | A |
PGOOD | 6 | VOUT = 0 V | B |
BST | 7 | VOUT = 0 V | B |
SW | 8 | VOUT = 0 V | B |
Pin Name | Pin No | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
GND | 1 | VOUT = 0 V | B |
VIN | 2 | D | |
EN/UVLO | 3 | D | |
RON | 4 | VIN > 5.5 V can lead to device damage. | A |
FB | 5 | VIN > 5.5 V can lead to device damage. | A |
PGOOD | 6 | VIN > 14 V can lead to device damage. | A |
BST | 7 | VOUT = 0 V | B |
SW | 8 | VOUT = VIN. PGOOD can be damaged if VIN > 14 V. | A |