SFFS577 February 2024 LM74900-Q1 , LM74910-Q1
ADVANCE INFORMATION
This section provides a Failure Mode Analysis (FMA) for the pins of the LM74900-Q1, LM74910-Q1. The failure modes covered in this document include the typical pin-by-pin failure scenarios:
Table 4-2 through Table 4-5 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.
Class | Failure Effects |
---|---|
A | Potential device damage that affects functionality |
B | No device damage, but loss of functionality |
C | No device damage, but performance degradation |
D | No device damage, no impact to functionality or performance |
Figure 4-1 shows the LM749x0-Q1 pin diagram. For a detailed description of the device pins please refer to the Pin Configuration and Functions section in the LM749x0-Q1 data sheet.
The pin FMA is provided under the assumption that the device is operating under the specified ranges within the Recommended Operating Conditions section of the data sheet.
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
DGATE |
1 |
Device is damaged due to internal conduction. External DGATE FET can also damage due to maximum VGS rating violation. |
A |
A |
2 |
Input supply shorted to ground. Device not functional. |
B |
SW |
3 |
Device is damaged if enabled. |
A |
UVLO |
4 |
Device HGATE drive is off. |
B |
OV |
5 |
Overvoltage protection functionality is disabled. |
B |
EN |
6 |
Device is in shutdown mode. |
B |
SLEEP |
7 |
Device is in SLEEP mode. |
B |
N.C |
8, 17, 21 |
No effect on device operation. |
D |
TMR |
9 |
Timer functionality is not be available. |
B |
IMON |
10 |
Current monitoring output is not available. |
B |
ILIM |
11 |
Overcurrent protection with circuit breaker feature is not be available. |
B |
FLT |
12 |
Fault indication functionality is not be available. |
B |
GND |
13 |
No impact on the device functionality. |
D |
HGATE |
14 |
Device is damaged. |
A |
OUT |
15 |
External FET VGS(max) rating can exceed and damage external FET. Device can experience increase in quiescent current. |
D |
SLEEP_OV |
16 |
Overvoltage protection during SLEEP mode is not available. |
B |
ISCP |
18 |
Device damage is expected due to internal current flow. |
A |
CS- |
19 |
Device damage is expected due to internal current flow. |
A |
CS+ |
20 |
Device damage is expected due to internal current flow. |
A |
VS |
22 |
Device does not power up. |
B |
CAP |
23 |
Device is damaged due to internal conduction between VS and CAP. |
A |
C |
24 |
Linear regulation and reverse current blocking functionality is not available. Device quiescent current can increase. |
B |
RTN |
— |
Input reverse polarity protection feature is not available. |
B |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
DGATE | 1 | Ideal diode FET can not be controlled. Reverse current blocking feature is not available. Load current flows through body diode of the FET. | B |
A | 2 | Ideal diode FET is turned off due to linear regulation sink current. Load current flows through body diode of the FET. | B |
SW | 3 | Battery voltage monitoring feature is not available. | B |
UVLO | 4 | Device HGATE drive is off due to internal pull down on UVLO pin. | B |
OV | 5 | Overvoltage protection functionality is disabled as OV pin is internally pulled low. | B |
EN | 6 | Device is in shutdown mode as EN pin is internally pulled low. | B |
SLEEP | 7 | SLEEP mode feature is not available. | B |
N.C | 8, 17, 21 | No effect on device operation. | D |
TMR | 9 | Device operation with default timer operation. Auto retry timer can not be set using external timer capacitor. | B |
IMON | 10 | Current monitoring output is not available. | B |
ILIM | 11 | ILIM pin is pulled high and device is in overcurrent protection mode. | B |
FLT | 12 | Fault indication functionality is not available. | B |
GND | 13 | Device does not power up. | D |
HGATE | 14 | HGATE control to turn on/off external FET is not available. | B |
OUT | 15 | HGATE control to turn on/off external FET is not available. | D |
SLEEP_OV | 16 | Overvoltage protection during SLEEP mode is not available. | B |
ISCP | 18 | Short circuit protection feature is not available. | B |
CS- | 19 | Device is in overcurrent protection mode and HGATE drive is turned off. | B |
CS+ | 20 | Overcurrent protection and current monitoring output is not available. | B |
VS | 22 | Device does not power up. | B |
CAP | 23 | Charge pump does not build up and gate drives DGATE and HGATE are disabled. | B |
C | 24 | DGATE drive remains off. | B |
RTN | — | No effect on device operation. | D |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
DGATE | 1 | Ideal diode FET is off. Load current flows through body diode of the FET. | B |
A | 2 | No effect on device operation. | D |
SW | 3 | UVLO feature is not available. | B |
UVLO | 4 | Either OV or UVLO comparator trigger and HGATE is off. | B |
OV | 5 | HGATE drive is off in case device is enabled (EN=High). | B |
EN | 6 | No effect on device operation. | D |
SLEEP | 7 | No effect on device operation. | D |
N.C | 8, 17, 21 | No effect on device operation. | D |
TMR | 9 | Timer (TMR) and current monitoring (IMON) functionality are out of data sheet specification. | B |
IMON | 10 | Current monitoring output is out of data sheet specification. | B |
ILIM | 11 | Device is in overcurrent protection mode based on FLT voltage level. | B |
FLT | 12 | No effect on device operation. | D |
GND | 13 | GND shorted to HGATE can cause device damage. | A |
HGATE | 14 | HGATE FET is off as HGATE is shorted to OUT causing VGS short condition. | B |
OUT | 15 | No effect on device operation. Device supports only overvoltage clamp operation during SLEEP mode. | B |
SLEEP_OV | 16 | No effect on device operation. | B |
ISCP | 18 | No effect on device operation. | D |
CS- | 19 | Short circuit and overcurrent protection is not available. | B |
CS+ | 20 | Overcurrent limit, current monitoring output parameters are out of specification. | B |
VS | 22 | Device charge pump does not come up. DGATE and HGATE drive are off. | B |
CAP | 23 | Device charge pump does not come up. DGATE and HGATE drive are off. | B |
C | 24 | No effect on device operation. | B |
RTN | — | No effect on device operation. | D |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
DGATE | 1 | DGATE is shorted to supply. Ideal diode FET remains off. | B |
A | 2 | No effect on device operation. | D |
SW | 3 | Battery voltage monitoring feature is available irrespective of EN pin status. | B |
UVLO | 4 | UVLO functionality is not available. | B |
OV | 5 | HGATE is turned off due to OV comparator input going high. | B |
EN | 6 | Device is always on as EN is pulled to supply. | B |
SLEEP | 7 | SLEEP mode feature is not available. | B |
N.C | 8, 17, 21 | No effect on device operation. | D |
TMR | 9 | Device is damaged if supply voltage level >5.5V. | A |
IMON | 10 | Device is damaged if supply voltage level >5.5V. | A |
ILIM | 11 | Device is damaged if supply voltage level >5.5V. | A |
FLT | 12 | Fault indication functionality is not available. | B |
GND | 13 | Device does not power up due to supply shorted to GND. | D |
HGATE | 14 | HGATE control to turn on/off external FET is not available. Device quiescent current can increase. | B |
OUT | 15 | Supply is shorted to output. Ideal diode (DGATE), load disconnect (HGATE) features will not be functional as supply is shorted to output. | B |
SLEEP_OV | 16 | Device is able to provide overvoltage cut-off functionality only during SLEEP mode. | B |
ISCP | 18 | Device has default short circuit protection threshold of 20mV. | B |
CS- | 19 | Overcurrent protection functionality is not available. | B |
CS+ | 20 | Device is in overcurrent protection mode. | B |
VS | 22 | No effect on device operation. | B |
CAP | 23 | Charge pump does not build up and gate drives DGATE and HGATE are disabled. | B |
C | 24 | Ideal diode functionality is not available (reverse current blocking). | B |
RTN | — | No effect on device operation. | D |