SFFS759 February 2024 CD4051B-Q1
The failure mode distribution estimation for the CD4051B-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity, and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures resulting from misuse or overstress.
Die Failure Modes | Failure Mode Distribution (%) |
---|---|
MUX no output (HIZ) | 30 |
MUX channel stuck on | 15 |
MUX channel stuck off | 15 |
MUX functional out of specification voltage or timing | 40 |