SFFS834 March 2024 DAC53204-Q1 , DAC63204-Q1
This section provides a failure mode analysis (FMA) for the pins of the DACx3204-Q1. The failure modes covered in this document include the typical pin-by-pin failure scenarios:
Table 4-2 through Table 4-5 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.
Class | Failure Effects |
---|---|
A | Potential device damage that affects functionality. |
B | No device damage, but loss of functionality. |
C | No device damage, but performance degradation. |
D | No device damage, no impact to functionality or performance. |
Figure 4-1 shows the DACx3204-Q1 pin diagram. For a detailed description of the device pins, see the Pin Configuration and Functions section in the DACx3204-Q1 data sheet.
Following are the assumptions of use and the device configuration assumed for the pin FMA in this section:
Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
---|---|---|---|
FB3 | 1 | Voltage output mode; OUT3 voltage value is always high | B |
Current output mode; no change in functionality or performance of OUT3 | D | ||
OUT3 | 2 | Voltage output mode; OUT3 will always be stuck at zero in case OUT3 is configured as open drain pull down | B |
Voltage output mode; device can sustain damage over a period of time in case of OUT3 is configured in push-pull mode | A | ||
Current output mode; output compliance voltage violation and loss of performance | C | ||
OUT2 | 3 | Voltage output mode; OUT2 will always be stuck at zero in case OUT2 is configured as open drain pull down | B |
Voltage output mode; device can sustain damage over a period of time in case of OUT2 is configured in push-pull mode | A | ||
Current output mode; output compliance voltage violation and loss of performance | C | ||
FB2 | 4 | Voltage output mode; OUT2 voltage value is always high | B |
Current output mode; no change in functionality or performance of OUT2 | D | ||
GPIO/SDO | 5 | Loss of GPIO functionality and read back data will be corrupted | B |
SCL/SYNC | 6 | Loss of communication with the device | B |
A0/SDI | 7 | Loss of communication with the device | B |
SDA/SCLK | 8 | Loss of communication with the device | B |
FB1 | 9 | Voltage output mode; OUT1 voltage value is always high | B |
Current output mode; no change in functionality or performance of OUT1 | D | ||
OUT1 | 10 | Voltage output mode; OUT1 will always be stuck at zero in case OUT1 is configured as open drain pull down | B |
Voltage output mode; device can sustain damage over a period of time in case of OUT1 is configured in push-pull mode | A | ||
Current output mode; output compliance voltage violation and loss of performance | C | ||
OUT0 | 11 | Voltage output mode; OUT0 will always be stuck at zero in case OUT0 is configured as open drain pull down | B |
Voltage output mode; device can sustain damage over a period of time in case of OUT0 is configured in push-pull mode | A | ||
Current output mode; output compliance voltage violation and loss of performance | C | ||
FB0 | 12 | Voltage output mode; OUT0 voltage value is always high | B |
Current output mode; no change in functionality or performance of OUT0 | D | ||
CAP | 13 | Loss of functionality; device enters short circuit protection, power consumption increases | B |
AGND | 14 | No change in functionality or performance | D |
VDD | 15 | Complete loss of functionality; no device damage | B |
VREF | 16 | Loss of core DAC functionality | B |
Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
---|---|---|---|
FB3 | 1 | Voltage output mode; OUT3 voltage will be an incorrect value | B |
Current output mode; no change in functionality or performance of OUT3 | D | ||
OUT3 | 2 | OUT3 output value is not available | B |
OUT2 | 3 | OUT2 output value is not available | B |
FB2 | 4 | Voltage output mode; OUT2 voltage will be an incorrect value | B |
Current output mode; no change in functionality or performance of OUT2 | D | ||
GPIO/SDO | 5 | Loss of GPIO functionality and read back data is not available | B |
SCL/SYNC | 6 | Loss of communication with the device | B |
A0/SDI | 7 | Loss of communication with the device | B |
SDA/SCLK | 8 | Loss of communication with the device | B |
FB1 | 9 | Voltage output mode; OUT1 voltage will be an incorrect value | B |
Current output mode; no change in functionality or performance of OUT1 | D | ||
OUT1 | 10 | OUT1 output value is not available | B |
OUT0 | 11 | OUT0 output value is not available | B |
FB0 | 12 | Voltage output mode; OUT0 voltage will be incorrect value | B |
Current output mode; no change in functionality or performance of OUT0 | D | ||
CAP | 13 | Open;circuited pin can cause damage to the low-voltage digital core and NVM supplied by the internal LDO | A |
AGND | 14 | Complete loss of functionality; no device damage | B |
VDD | 15 | Complete loss of functionality; no device damage | B |
VREF | 16 | External reference mode; loss of core DAC functionality | B |
Internal reference mode; no change in functionality or performance | D | ||
VDD as reference mode; no change in functionality or performance | D |
Pin Name | Pin No. | Shorted to | Description of Potential Failure Effects | Failure Effect Class |
---|---|---|---|---|
FB3 | 1 | VREF | Short to corner pin is not expected | D |
OUT3 | Voltage output mode; this is an intended connection | D | ||
OUT3 | Current output mode; no change in functionality or performance of OUT3 | D | ||
OUT3 | 2 | FB3 | Voltage output mode; this is an intended connection | D |
FB3 | Current output mode; no change in functionality or performance of OUT3 | D | ||
OUT2 | Device can sustain damage over a period of time | A | ||
OUT2 | 3 | OUT3migh | Device can sustain damage over a period of time | A |
FB2 | Voltage output mode; this is an intended connection | D | ||
FB2 | Current output mode; no change in functionality or performance of OUT2 | D | ||
FB2 | 4 | OUT2 | Voltage output mode; this is an intended connection | D |
OUT2 | Current output mode; no change in functionality or performance of OUT2 | D | ||
GPIO/SDO | Short to corner pin is not expected | D | ||
GPIO/SDO | 5 | FB2 | Short to corner pin is not expected | D |
SCL/SYNC | Loss of communication, GPI, and SDO functionality | B | ||
SCL/SYNC | 6 | GPIO/SDO | Loss of communication, GPI, and SDO functionality | B |
A0/SDI | Loss of communication with the device | B | ||
A0/SDI | 7 | SCL/SYNC | Loss of communication with the device | B |
SDA/SCLK | Loss of communication with the device | B | ||
SDA/SCLK | 8 | A0/SDI | Loss of communication with the device | B |
FB1 | Short to corner pin is not expected | D | ||
FB1 | 9 | SDA/SCLK | Short to corner pin is not expected | D |
OUT0 | Voltage output mode; this is an intended connection | D | ||
OUT0 | Current output mode; no change in functionality or performance of OUT1 | D | ||
OUT1 | 10 | FB1 | Voltage output mode; this is an intended connection | D |
FB1 | Current output mode; no change in functionality or performance of OUT1 | D | ||
OUT0 | Device can sustain damage over a period of time | A | ||
OUT0 | 11 | OUT1 | Device can sustain damage over a period of time | A |
FB0 | Voltage output mode; this is an intended connection | D | ||
FB0 | Current output mode; no change in functionality or performance of OUT0 | D | ||
FB0 | 12 | OUT0 | Voltage output mode; this is an intended connection | D |
OUT0 | Current output mode; no change in functionality or performance of OUT0 | D | ||
CAP | Short to corner pin is not expected | D | ||
CAP | 13 | FB0 | Short to corner pin is not expected | D |
AGND | Device enters short circuit protection; power consumption increases | B | ||
AGND | 14 | CAP | Device enters short circuit protection; power consumption increases | B |
VDD | Complete loss of functionality; no device damage | B | ||
VDD | 15 | AGND | Complete loss of functionality; no device damage | B |
VREF | External reference mode; loss of core DAC functionality | B | ||
VREF | Internal reference mode; loss of core DAC functionality | B | ||
VREF | VDD as reference mode; no change in functionality or performance | D | ||
VREF | 16 | VDD | External reference mode; loss of core DAC functionality | B |
VDD | Internal reference mode; loss of core DAC functionality | B | ||
VDD | VDD as reference mode; no change in functionality or performance | D | ||
FB3 | Short to corner pin is not expected | D |
Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
---|---|---|---|
FB3 | 1 | Voltage output mode; OUT3 voltage value is always low | B |
Current output mode; no change in functionality or performance of OUT3 | D | ||
OUT3 | 2 | Voltage output mode - device can sustain damage over a period of time | A |
Current output mode; output compliance voltage violation and loss of performance | C | ||
OUT2 | 3 | Voltage output mode; device can sustain damage over a period of time | C |
Current output mode; output compliance voltage violation and loss of performance | A | ||
FB2 | 4 | Voltage output mode; OUT2 voltage value is always low | \B |
Current output mode; no change in functionality or performance of OUT2 | D | ||
GPIO/SDO | 5 | Loss of GPIO functionality and read back data will be corrupted | B |
SCL/SYNC | 6 | Loss of communication with the device | B |
A0/SDI | 7 | Loss of communication with the device | B |
SDA/SCLK | 8 | Loss of communication with the device | B |
FB1 | 9 | Voltage output mode; OUT1 voltage value is always low | B |
Current output mode; no change in functionality or performance of OUT1 | D | ||
OUT1 | 10 | Voltage output mode; device can sustain damage over a period of time | A |
Current output mode; output compliance voltage violation and loss of performance | C | ||
OUT0 | 11 | Voltage output mode; device can sustain damage over a period of time | A |
Current output mode; output compliance voltage violation and loss of performance | C | ||
FB0 | 12 | Voltage output mode; OUT0 voltage value is always low | B |
Current output mode; no change in functionality or performance of OUT0 | D | ||
CAP | 13 | Shorting to VDD pin can cause damage to the low-voltage digital core and NVM supplied by the internal LDO | A |
AGND | 14 | Complete loss of functionality; no device damage | B |
VDD | 15 | No change in functionality or performance | D |
VREF | 16 | External reference mode; loss of core DAC functionality | B |
Internal reference mode; loss of core DAC functionality | B | ||
VDD as reference mode; no change in functionality or performance | D |