SFFS842 March 2024 TMCS1126-Q1
This section provides a Failure Mode Analysis (FMA) for the pins of the TMCS1126-Q1. The failure modes covered in this document include the typical pin-by-pin failure scenarios:
Table 4-2 through Table 4-5 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.
Class | Failure Effects |
---|---|
A | Potential device damage that affects functionality |
B | No device damage, but loss of functionality |
C | No device damage, but performance degradation |
D | No device damage, no impact to functionality or performance |
Figure 4-1 shows the TMCS1126-Q1 pin diagram. For a detailed description of the device pins please refer to the Pin Configuration and Functions section in the TMCS1126-Q1 data sheet.
Following are the assumptions of use and the device configuration assumed for the pin FMA in this section:
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
IN+ | 1 | For forward current, hall-sensor bypassed, providing no signal to be sensed and amplified. If IN+ is at a large potential above GND, this will result in a lot of current being sunk. Depending upon layout and configuration, this could damage the input current system supply, the load device, or the IC itself. | A |
IN- | 2 | For reverse current, hall-sensor bypassed, providing no signal to be sensed and amplified. If IN- is at a large potential above GND, this will result in a lot of current being sunk. Depending upon layout and configuration, this could damage the input current system supply, the load device, or the IC itself. | A |
OC | 3 | The Alert will not be able to trigger since it would be shorted to GND. | B |
VS | 4 | Power supply shorted to ground. | B |
VOC | 5 | Threshold at GND means that all voltages trip the Alert, so the Alert would be stuck in active mode. | B |
VOUT | 6 | Output pulled to GND and output current will be short circuit limited. When left in this configuration while VS connected to a high load capable supply and for certain high load conditions through the IN+ and IN- pins, die temperature could approach or exceed 150°C. | A |
VREF | 7 | VREF shorted to GND and output current will be short circuit limited. | B |
NC | 8 | Normal Operation. | D |
GND | 9 | Normal Operation. | D |
NC | 10 | Normal Operation. | D |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
IN+ | 1 | No current running through inputs. | B |
IN- | 2 | No current running through inputs. | B |
OC | 3 | Alert open, won't be able to read alert. | B |
VS | 4 | No power to device. Vout will stay close to GND. | B |
VOC | 5 | No alert threshold set, alert output will be unpredictable. | B |
VOUT | 6 | Output will be present at the pin; having no loading will not affect the output. However, the user will see unpredictable results further down on the signal chain. | B |
VREF | 7 | VREF will be present at the pin; having no loading will not affect the device. However, the user will see unpredictable results further down on the signal chain. | B |
NC | 8 | Normal Operation. | D |
GND | 9 | GND is floating. Output will be incorrect as it is no longer referenced to GND. | B |
NC | 10 | Normal Operation. | D |
Pin Name | Pin No. | Shorted to | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|---|
IN+ | 1 | IN- | IN+ shorted to IN-. This creates a current divider which increase sensitivity error inversely proportional to the resistance of the short. | C |
IN- | 2 | OC | IN- shorted to OC. If IN->6V, the device will be damaged. If IN- < OC, Large current may be pulled from VS. | A |
OC | 3 | VS | OC shorted to VS. Large current may be pulled from VS. | A |
VS | 4 | VOC | VOC shorted to VS, over current threshold will be at the wrong threshold. | B |
VOC | 5 | VOUT | VOC shorted to VOUT. Over current threshold will vary, alert response will be unpredictable. | B |
VOUT | 6 | VREF | Output shorted to VREF. Based on the voltage level of each, the output current may be short circuit limited. When left in this configuration while VS connected to a high load capable supply and for certain high load conditions through the IN+ and IN- pins, die temperature could approach or exceed 150°C. | A |
VREF | 7 | NC | VREF either left open, or shorted to VS or GND depending on NC pin connection. | D if NC is open, B otherwise |
NC | 8 | GND | If NC at GND or open, then normal operation. If NC at VS, then VS shorted to GND. | B if NC is at VS, D otherwise |
GND | 9 | NC | If NC at GND or open, then normal operation. If NC at VS, then VS shorted to GND. | B if NC is at VS, D otherwise |
NC | 10 | IN+ | If IN+> 6V, the device may be damaged. If NC is at VS and IN+ < Vs or if NC is at GND and IN+ is at a large potential above ground, large current may be flowing between VS and the input current system supply. | A if IN+>6V; B otherwise |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
IN+ | 1 | If IN+>6V, the device will be damaged. If IN+ < Vs, a lot of current may be pulled from VS. | A |
IN- | 2 | If IN->6V, the device will be damaged. If IN- < Vs, a lot of current may be pulled from VS. | A |
OC | 3 | OC pin stuck high, may have too high current draw when triggered. | B |
VS | 4 | Normal operation. | D |
VOC | 5 | Over current threshold at the wrong threshold. | B |
VOUT | 6 | Output pulled to VS and output current will be short circuit limited. When left in this configuration while VS connected to a high load capable VS and for certain high load conditions through the IN+ and IN- pins, die temperature could approach or exceed 150°C. | A |
VREF | 7 | VREF pulled to VS and output current will be short circuit limited. | B |
NC | 8 | Normal operation. | D |
GND | 9 | VS shorted to GND. | B |
NC | 10 | Normal operation. | D |