SFFS927 July 2024 ISO7741TA-Q1 , ISO7741TB-Q1
The failure mode distribution estimation for the ISO7741Tx-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity, and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures resulting from misuse or overstress.
Die Failure Modes | Failure Mode Distribution (%) |
---|---|
D1 FET, D2 FET, or both FETs stuck OFF | 16 |
D1 FET, D2 FET, or both FETs stuck ON | 12 |
D1 FET, D2 FET, or both FETs output not in timing or voltage specification | 7 |
D1 FET, D2 FET or both FETs output undetermined | 2 |
OUTx state undetermined | 22 |
OUTx not in timing or voltage specification | 19 |
OUTx stuck to default state | 16 |
OUTx stuck high | 3 |
OUTx stuck low | 3 |
The FMD in Table 3-1 excludes short-circuit faults across the isolation barrier. Faults for short circuits across the isolation barrier can be excluded according to ISO 61800-5-2:2016 if the following requirements are fulfilled:
Apply creepage and clearance requirements according to the specific equipment isolation standards of an application. Care must be taken to maintain the creepage and clearance distance of a board design to ensure that the mounting pads of the isolator on the printed-circuit board do not reduce this distance.