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This document contains information for the TPS3703 (DSE package) to aid in a functional safety system design. Information provided are:
Figure 1-1 shows the device functional block diagram for reference.
The TPS3703 was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.
This section provides functional safety failure in time (FIT) rates for TPS3703 based on two different industry-wide used reliability standards:
FIT IEC TR 62380 / ISO 26262 | FIT (Failures Per 109 Hours) |
---|---|
Total component FIT rate | 4 |
Die FIT rate | 2 |
Package FIT rate | 2 |
The failure rate and mission profile information in Table 2-1 comes from the reliability data handbook IEC TR 62380 / ISO 26262 part 11:
Table | Category | Reference FIT Rate | Reference Virtual TJ |
---|---|---|---|
5 | CMOS,
BICMOS Digital, analog, or mixed |
25 FIT | 55°C |
The reference FIT rate and reference virtual TJ (junction temperature) in Table 2-2 come from the Siemens Norm SN 29500-2 tables 1 through 5. Failure rates under operating conditions are calculated from the reference failure rate and virtual junction temperature using conversion information in SN 29500-2 section 4.
The failure mode distribution estimation for TPS3703 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity, and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.
Die Failure Modes | Failure Mode Distribution (%) |
---|---|
nRESET fails to trip | 15 |
nRESET false trip | 15 |
nRESET trip outside specification (voltage or time) | 65 |
nRESET delay outside specification | 5 |
This section provides a failure mode analysis (FMA) for the pins of the TPS3703. The failure modes covered in this document include the typical pin-by-pin failure scenarios:
Table 4-2 through Table 4-6 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.
Class | Failure Effects |
---|---|
A | Potential device damage that affects functionality. |
B | No device damage, but loss of functionality. |
C | No device damage, but performance degradation. |
D | No device damage, no impact to functionality or performance. |
Figure 4-1 shows the TPS3703 pin diagram. For a detailed description of the device pins please refer to the Pin Configuration and Functions section in the TPS3703 data sheet.
Following are the assumptions of use and the device configuration assumed for the pin FMA in this section:
Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
---|---|---|---|
SENSE | 1 | No damage to device, can affect application functionality. Shorts voltage supply to ground, increases current. | C |
VDD | 2 | No damage to device, can affect application functionality. Shorts voltage supply to ground, increases current. | C |
CT | 3 | Normal operation, device in latch mode. Usually has pull-down resistance to limit currEnt. | D |
/RESET | 4 | No damage to device, can affect application functionality. Forces /reset to be asserted. | C |
GND | 5 | Normal operation. | D |
/MR | 6 | Normal operation in some cases, but forces /reset to be asserted. | C |
Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
---|---|---|---|
SENSE | 1 | No damage to device, can affect application functionality. /Reset tends to be low. | C |
VDD | 2 | No damage to device, but device is not powered. /Reset tends to be low. | C |
CT | 3 | Normal operation. | D |
/RESET | 4 | Open drain output requires pull-up voltage for functionality. | C |
GND | 5 | No damage to device, but device is not powered. /Reset tends to be low. | C |
/MR | 6 | Normal operation. Pin is internally pulled up to VDD. | D |
Pin Name | Pin No. | Shorted to | Description of Potential Failure Effects | Failure Effect Class |
---|---|---|---|---|
SENSE | 1 | VDD | Normal operation in some applications. Functionality affected with separate supply for sense, but no damage. | C |
VDD | 2 | CT | Normal operation. Usually has pull-up resistance to limit current. | D |
CT | 3 | /RESET | No damage to device, but device is not powered. /Reset tends to be low. | C |
/RESET | 4 | GND | No damage to device, can affect application functionality. Forces /reset to be asserted. | C |
GND | 5 | /MR | Normal operation in some cases, but forces /reset to be asserted. | C |
/MR | 6 | SENSE | Undefined operation, but functionality can be affected. When MR is asserted, SENSE shorts to GND. | C |
Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
---|---|---|---|
SENSE | 1 | Normal operation in some applications. Functionality affected with separate supply for sense, but no damage. | C |
VDD | 2 | Normal operation. | D |
CT | 3 | Normal operation. Usually has pull-up resistance to limit current. | D |
/RESET | 4 | Normal operation. Usually has pull-up resistance to limit current. | D |
GND | 5 | No damage to device, can affect application functionality. Shorts voltage supply to ground, increases current. | C |
/MR | 6 | Normal operation, but increased leakage current. Internally pulled-up to VDD to limit current. | D |
Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
---|---|---|---|
SENSE | 1 | No damage to device, can affect application functionality. Forces /reset to equal sense voltage. | C |
VDD | 2 | Normal operation. Usually has pull-up resistance to limit current. | D |
CT | 3 | No damage to device, can affect application functionality. /Reset tends to be low. | C |
/RESET | 4 | Normal operation. | D |
GND | 5 | No damage to device, can affect application functionality. Forces /reset to be asserted. | C |
/MR | 6 | No damage to device, can affect application functionality. Forces /RESET to latch. | C |