SFFSA11 October   2024 SN74LVC1G66-Q1

 

  1.   1
  2. 1Overview
  3. 2Functional Safety Failure In Time (FIT) Rates
    1. 2.1 SOT-23 Package
    2. 2.2 SOT-SC70 Package
  4. 3Failure Mode Distribution (FMD)
  5. 4Pin Failure Mode Analysis (Pin FMA)

1 Overview

This document contains information for SN74LVC1G66-Q1 (SOT-23 and SOT-SC70 packages) to aid in a functional safety system design. Information provided is:

  • Functional safety failure in time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
  • Component failure modes and their distribution (FMD) based on the primary function of the device
  • Pin failure mode analysis (pin FMA)

Figure 1-1 shows the device functional block diagram for reference.

SN74LVC1G66-Q1 Functional Block DiagramFigure 1-1 Functional Block Diagram

SN74LVC1G66-Q1 was developed using a quality-managed development process but was not developed in accordance with the IEC 61508 or ISO 26262 standards.