SFFSA43 December 2024 LM5125-Q1
Figure 4-1 shows the LM5125-Q1 pin diagram for the VQFN package. For a detailed description of the device pins, see the Pin Configuration and Functions section in the LM5125-Q1 data sheet.
Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
---|---|---|---|
DLY | 1 | If average input current loop feature is used the average input current loop is not get activated. | B |
D | |||
SS | 2 | Device does not start, no switching. | B |
COMP | 3 | VOUT out of regulation, not switching. | B |
AGND | 4 | No effect. | D |
CSN1 | 5 | Device can be damaged if the differential voltage exceeds the 0.3V absolute maximum rating. | A |
CSP1 | 6 | Device can be damaged if the differential voltage exceeds the 0.3V absolute maximum rating. | A |
VOUT | 7 | External components can be damaged. Device potentially goes into latch state or does not start. | B |
HO1 | 8 | Phase 1 high-side driver can be damaged when device starts switching. | A |
HB1 | 9 | Device can be damaged when BOOT charging starts. | A |
SW1 | 10 | No energy transferred from input to output. | B |
LO1 | 11 | Phase 1 low-side driver can be damaged when device starts switching. | A |
VCC | 12 | Loss of VCC regulation, no switching. | B |
PGND | 13 | No effect. | D |
LO2 | 14 | Phase 1 low-side driver can be damaged when device starts switching. | A |
SW2 | 15 | No energy transferred from input to output. | B |
HB2 | 16 | Device can be damaged when BOOT charging starts. | A |
HO2 | 17 | Phase 2 high-side driver can be damaged when device starts switching. | A |
BIAS | 18 | Device not powered and therefore not functional. | B |
UVLO/EN | 19 | Device is disabled. | B |
CSP2 | 20 | Device can be damaged if the differential voltage exceeds the 0.3V absolute maximum rating. | A |
CSN2 | 21 | Device can be damaged if the differential voltage exceeds the 0.3V absolute maximum rating. | A |
RT | 22 | Device goes to maximum switching frequency >2.2MHz. | C |
SYNCOUT | 23 | SYNCOUT-pin can be damaged if device configuration has SYNCOUT function enabled. | A |
D | |||
SYNCIN | 24 | Clock synchronization is disabled, device uses internal clock. | C |
CFG2 | 25 | CFG2 level-1 is forced. | C |
CFG1 | 26 | CFG1 level-1 is forced. | C |
CFG0 | 27 | CFG0 level-1 is forced. | C |
PGOOD | 28 | Correct output voltage, but loss of power-good functionality. | B |
MODE | 29 | Diode emulation mode is activated. No effect if the device is configured for diode emulation mode (MODE = GND). | C |
D | |||
EN2 | 30 | If second phase is used, second phase is disabled. | C |
D | |||
ILIM/IMON | 31 | Average input current loop is not activated. Current monitoring is not working. | B |
ATRK/DTRK | 32 | No output voltage regulation. Device enters BYPASS mode after soft start is complete. | B |
Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
---|---|---|---|
DLY | 1 | If delay pin function is used, the delay programming does not work. | B |
D | |||
SS | 2 | Short soft-start time. | C |
COMP | 3 | Device can be unstable. | B |
AGND | 4 | Possible device damage. | A |
CSN1 | 5 | Loss of current sense signal for phase 1. Peak current limit does not work. | B |
CSP1 | 6 | Loss of current sense signal for phase 1. Peak current limit does not work. | B |
VOUT | 7 | Internal feedback voltage for regulation loop is pulled to GND, VOUT reaches OVP_max. | B |
HO1 | 8 | Loss of high-side driver. | B |
HB1 | 9 | Loss of boot voltage and hence high-side driver. | B |
SW1 | 10 | Loss of high-side driver. | B |
LO1 | 11 | Low-side MOSFET never switched for phase 1. | B |
VCC | 12 | No stable VCC to sustain normal operation. | B |
PGND | 13 | Possible device damage. | A |
LO2 | 14 | Low-side MOSFET never switched for phase 2. | B |
SW2 | 15 | Loss of high-side driver. | B |
HB2 | 16 | Loss of boot voltage and hence high side driver. | B |
HO2 | 17 | Loss of high side driver. | B |
BIAS | 18 | Device not powered and therefore not functional. | B |
UVLO/EN | 19 | Device is disabled. | B |
CSP2 | 20 | Loss of current sense signal for phase 2. Peak current limit does not work. | B |
CSN2 | 21 | Loss of current sense signal for phase 2. Peak current limit does not work. | B |
RT | 22 | Minimum frequency is set. | C |
SYNCOUT | 23 | Primary functions normally. Secondary does not get clock in multi-device configuration. | C |
B | |||
SYNCIN | 24 | Clock synchronization is not working, device uses internal clock. | C |
CFG2 | 25 | CFG2 level-16 is forced. | C |
CFG1 | 26 | CFG1 level-16 is forced. | C |
CFG0 | 27 | CFG0 level-16 is forced. | C |
PGOOD | 28 | Correct output voltage, but loss of power-good functionality. | B |
MODE | 29 | No effect if DEM mode is active, otherwise DEM mode is activated. | D |
C | |||
EN2 | 30 | Second phase enable potentially does not function as intended. | C |
ILIM/IMON | 31 | Device operates in average input current limit loop operation, VOUT drops and is therefore out of regulation. | B |
ATRK/DTRK | 32 | Device goes to OVPmax. | B |
Pin Name | Pin No. | Shorted to | Description of Potential Failure Effects | Failure Effect Class |
---|---|---|---|---|
DLY | 1 | SS | Loss of delay function, average input current loop does not function as intended. | B |
SS | 2 | COMP | Device operates in peak current limit and output voltage rises to OVPmax. | B |
COMP | 3 | AGND | VOUT regulation loop does not function, internal supply can collapse. | B |
AGND | 4 | CSN1 | Device can be damaged due to the differential voltage exceeds the 0.3V absolute maximum rating. | A |
CSN1 | 5 | CSP1 | Loss of current sense information. Circuit possibly unstable. | B |
CSP1 | 6 | VOUT | Output shorted to input supply. No output regulation. | B |
VOUT | 7 | HO1 | Possible device damage as HO to switch exceeds absolute maximum voltage rating. | A |
HO1 | 8 | HB1 | Possible device damage when switching starts. | A |
HB1 | 9 | SW1 | Loss of high side driver. | B |
SW1 | 10 | LO1 | Possible device damage as absolute maximum rating exceeded at LO-pin. | A |
LO1 | 11 | VCC | LO not switching. Possible device damage when switching starts. | A |
VCC | 12 | PGND | No VCC rail, no switching. | B |
PGND | 13 | LO2 | Device can be damaged when switching starts. | A |
LO2 | 14 | SW2 | Possible device damage as absolute maximum rating exceeded at LO-pin. | A |
SW2 | 15 | HB2 | Loss of high side driver. | B |
HB2 | 16 | HO2 | Possible device damage when switching starts. | A |
HO2 | 17 | BIAS | Possible damage as HO2-pin can exceed the HO2 to SW2 absolute maximum voltage rating. | A |
BIAS | 18 | UVLO/EN | Loss of UVLO function, device always enabled. | B |
C | ||||
UVLO/EN | 19 | CSP2 | Wrong current sense information, current limit can be wrong. | B |
CSP2 | 20 | CSN2 | Loss of current sense information. Circuit possibly unstable. | B |
CSN2 | 21 | RT | Possible device damage. Exceeds absolute maximum voltage rating for RT. | A |
RT | 22 | SYNCOUT | Device operates at maximum switching frequency at start-up. When SYNCOUT starts switching, switching is unstable. | C |
SYNCOUT | 23 | SYNCIN | Loss of frequency sync function, unstable switching frequency. | B |
SYNCIN | 24 | CFG2 | Loss of frequency sync function and/or wrong configuration 2. | B |
CFG2 | 25 | CFG1 | Wrong configuration 1 and/or configuration 2. | B |
CFG1 | 26 | CFG0 | Wrong configuration 1 and/or configuration 0. | B |
CFG0 | 27 | PGOOD | Loss of configuration 0 function. | B |
PGOOD | 28 | MODE | MODE function effected, device can function in incorrect operation mode based on PGOOD output. | C |
MODE | 29 | EN2 | Wrong operation MODE or phase 2 enabled or disabled incorrectly depending on what voltage is driven. | B |
EN2 | 30 | ILIM/IMON | If EN2 is driven high, then the device is forced to function in average input current limit mode. If driven low, loss of ILIM/IMON function. | B |
ILIM/IMON | 31 | ATRK/DTRK | Output voltage not regulated to target intended value and loss of IMON/ILIM function. | B |
ATRK/DTRK | 32 | DLY | Output voltage is not regulated to target intended value, average input current limit does not work as intended. | B |
Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
---|---|---|---|
DLY | 1 | Possible device damage. Exceeds absolute maximum voltage rating. | A |
SS | 2 | Possible device damage. Exceeds absolute maximum voltage rating. | A |
COMP | 3 | Possible device damage. Exceeds absolute maximum voltage rating. | A |
AGND | 4 | Possible device damage. Exceeds absolute maximum voltage rating. | A |
CSN1 | 5 | Loss of current sense signal. Circuit possibly unstable. | B |
CSP1 | 6 | Normal operation. | D |
VOUT | 7 | Loss of VOUT regulation as output voltage is forced to VI. | B |
HO1 | 8 | Possible device damage as HO1-pin can exceed the HO1 to SW1 absolute maximum voltage rating. | A |
HB1 | 9 | Possible device damage as HB1 exceeds HB1 to SW1 absolute maximum voltage rating. | A |
SW1 | 10 | No energy is transferred from input to output. | B |
LO1 | 11 | Possible device damage. Exceeds absolute maximum voltage rating. | A |
VCC | 12 | Possible device damage. Exceeds absolute maximum voltage rating. | A |
PGND | 13 | Possible device damage. | A |
LO2 | 14 | Possible device damage. Exceeds absolute maximum voltage rating. | A |
SW2 | 15 | No energy is transferred from input to output. | B |
HB2 | 16 | Possible device damage as HB2 exceeds HB2 to SW2 absolute maximum voltage rating. | A |
HO2 | 17 | Possible device damage as HO2 pin can exceed the HO2 to SW2 absolute maximum voltage rating. | A |
BIAS | 18 | Normal operation. | D |
UVLO/EN | 19 | No UVLO functionality, device is enabled or disabled with VI. | B |
C | |||
CSP2 | 20 | Normal operation. | D |
CSN2 | 21 | Loss of current sense signal. Circuit possibly unstable. | B |
RT | 22 | Possible device damage. Exceeds absolute maximum voltage rating. | A |
SYNCOUT | 23 | Possible device damage. Exceeds absolute maximum voltage rating. | A |
SYNCIN | 24 | Possible device damage. Exceeds absolute maximum voltage rating. | A |
CFG2 | 25 | Possible device damage. Exceeds absolute maximum voltage rating. | A |
CFG1 | 26 | Possible device damage. Exceeds absolute maximum voltage rating. | A |
CFG0 | 27 | Possible device damage. Exceeds absolute maximum voltage rating. | A |
PGOOD | 28 | Possible device damage. Exceeds absolute maximum voltage rating. | A |
MODE | 29 | Possible device damage. Exceeds absolute maximum voltage rating. | A |
EN2 | 30 | Possible device damage. Exceeds absolute maximum voltage rating. | A |
ILIM/IMON | 31 | Possible device damage. Exceeds absolute maximum voltage rating. | A |
ATRK/DTRK | 32 | Possible device damage. Exceeds absolute maximum voltage rating. | A |