SLAAED9 November 2023 TAA5412-Q1 , TAC5311-Q1 , TAC5312-Q1 , TAC5411-Q1 , TAC5412-Q1
Once a fault has occurred and an interrupt is generated, the diagnostic registers can be used to determine present faults. For most applications, the latched registers is used to identify faults since these register can be transient and are no longer reflected in the live registers. When reading latched registers, reading each of the latched fault registers is recommended to verify that all errors are detected and that the latches are reset accordingly. The exact sequence of register reads occurring depends on the application and mask settings. The following is provided as a default recommended sequence to avoid missing faults.
Since reading the overvoltage register in INT_LTCH1 clears the short to VBAT_IN bits in the IN_CHx_LTCH registers, not detecting a short to VBAT_IN is possible if the short is a transient short. Detecting an overvoltage is preferred since any short to VBAT_IN also triggers an overvoltage fault as long as VBAT_IN > MICBIAS (as is the case in most applications). Furthermore, a short to VBAT_IN is less likely to be transient in nature, and is still readable in the respective latched or live register depending on the LTCH_CLR_ON_READ setting.