SLAU723A October 2017 – October 2018 MSP432E401Y , MSP432E411Y
The Joint Test Action Group (JTAG) port is an IEEE standard that defines a Test Access Port (TAP) and Boundary Scan Architecture for digital integrated circuits and provides a standardized serial interface for controlling the associated test logic. The TAP, Instruction Register (IR), and Data Register (DR) can be used to test the interconnections of assembled printed-circuit boards and obtain manufacturing information on the components. The JTAG port also provides a means of accessing and controlling design-for-test features such as I/O pin observation and control, scan testing, and debugging.