SLAU903 October 2023
The diagnostics test circuitry, as shown in Figure 3-14, is not connected to any channel by default. To test IN1P and IN1M diagnostic, configure the inputs as DC coupled and populate jumper headers on J43 and J44.
The diagnostic test selection is done by populating one jumper at any one time on J45 header either for input to MICBIAS short, input to VBAT short, input to input short or input to ground short. Once the connection is established, press SW2 to initiate the test, the fault detection can then be verified through the device register. The bidirectional arrow indicates moving the switch to left for IN1P test and to the right for IN1M test.
TI's recommended settings for this diagnostics test circuit are discussed in this section. The following figures below are based on newer EVM revision which has IN1P and IN1M connected by default through J43 and J44.