SLAZ163N October   2012  – May 2021 MSP430F2132 , MSP430F2132-EP

 

  1. 1Functional Advisories
  2. 2Preprogrammed Software Advisories
  3. 3Debug Only Advisories
  4. 4Fixed by Compiler Advisories
  5. 5Nomenclature, Package Symbolization, and Revision Identification
    1. 5.1 Device Nomenclature
    2. 5.2 Package Markings
      1.      RHB32
      2.      PW28
    3. 5.3 Memory-Mapped Hardware Revision (TLV Structure)
  6. 6Advisory Descriptions
    1. 6.1  BCL12
    2. 6.2  BCL13
    3. 6.3  BCL16
    4. 6.4  CPU19
    5. 6.5  EEM20
    6. 6.6  FLASH19
    7. 6.7  FLASH24
    8. 6.8  FLASH27
    9. 6.9  FLASH36
    10. 6.10 PORT12
    11. 6.11 SYS15
    12. 6.12 TA12
    13. 6.13 TA16
    14. 6.14 TA21
    15. 6.15 TAB22
    16. 6.16 USCI20
    17. 6.17 USCI21
    18. 6.18 USCI22
    19. 6.19 USCI23
    20. 6.20 USCI24
    21. 6.21 USCI25
    22. 6.22 USCI26
    23. 6.23 USCI28
    24. 6.24 USCI30
    25. 6.25 USCI34
    26. 6.26 USCI35
    27. 6.27 USCI40
    28. 6.28 XOSC5
    29. 6.29 XOSC8
  7. 7Revision History

6.9 FLASH36

FLASH Module

Category

Functional

Function

Flash content may degrade due to aborted page erases

Description

If a page erase is aborted by EEIEX, the flash page containing the last instruction before erase operation will start to degrade. This effect is incremental and, after repetitions, may lead to corrupted flash content.

Workaround

- Use the EEI (interrupted erasing) feature instead of EEIEX (abort erasing).
or
- A PSA checksum can be calculated over affected flash page using the marginal read mode (marginal 0). If PSA sum differs from expected PSA value the affected flash page has to be reprogrammed.
or
- Start flash erasing from RAM and limit system frequency to <1MHz (to ensure 6-us delay after EEIEX).  If the last instruction before erasing is located in RAM, flash cell degradation does not occur.