SLLU313A May 2019 – February 2022 TLIN1021-Q1
The TLIN1021DEVM provides users with the ability to evaluate the TI TLINx021A-Q1 and TLINx027-Q1 single-channel, LIN transceivers. The EVM allows both commander and responder mode applications to be evaluated through the use of a single jumper that connects or disconnects the external 1-kΩ pullup resistor and series diode required in commander mode from the LIN bus.
The EVM has a low-voltage VCC rail that provides the voltage to the pull-up resistors on the received data (RXD) open-drain output, and enable (EN) control input pins. The TLINx021A-Q1 and TLINx027-Q1 support a VIH from 2-V to 5.5-V, allowing operation with a variety of microcontrollers with common IO voltage levels such as 2.5-V, 3.3-V, and 5-V. Non-populated capacitor pads are available on the TXD and RXD pins to accommodate a variety of different tests requiring various capacitive load conditions.
The TLINx021A-Q1 and TLINx027-Q1 families support both 12-V and 24-V automotive applications. The TLIN1021A-Q1 and TLIN2027-Q1 devices both operate with a VSUP from 4.5-V to 36-V and have ±45-V LIN bus fault protection. Use the EVM to evaluate the TLIN1021A-Q1 or TLIN1027-Q1 device for 12-V automotive applications. The TLIN2021A-Q1 and TLIN2027-Q1 devices both operate with a VSUP from 4.5-V to 45-V and have ±60-V bus fault protection. Use the TLIN2021A-Q1 or the TLIN2027-Q1 device for 24-V automotive applications. See the device data sheets for specific information regarding recommended operating conditions.
Furthermore, the TLINx021A-Q1 transceivers include internally-protected bus terminals with greater than ±8-kV HBM and IEC ESD protection levels. If additional ESD protection is desired, a MMBZ27VCL diode is populated on the LIN bus. This can easily be removed to test other ESD diodes as well, as it is the common SOT23 package for ESD diodes. Both headers and wire-terminals are provided on the power and LIN bus connections to allow the EVM to be evaluated in a larger system while still allowing for test equipment to be connected to the signals under test.