SLUSDG3F August 2018 – September 2024
PRODUCTION DATA
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
tRISE | Output rise time, 20% to 80% measured points | COUT = 1.8 nF | 6 | 16 | ns | |
tFALL | Output fall time, 90% to 10% measured points | COUT = 1.8 nF | 7 | 12 | ns | |
tPWmin | Minimum pulse width | Output off for less than minimum, COUT = 0pF | 20 | ns | ||
tPDHL | Propagation delay from INx to OUTx falling edges | 26 | 33 | 45 | ns | |
tPDLH | Propagation delay from INx to OUTx rising edges | 26 | 33 | 45 | ns | |
tPWD | Pulse width distortion |tPDLH – tPDHL| | 6 | ns | |||
tDM | Propagation Delay Matching for Dual Channel Driver | Input Pulse Width = 100ns, 500kHz, TJ = -40°C to -10°C |tPDLHA – tPDLHB|, |tPDHLA – tPDHLB| |
6.5 | ns | ||
Input Pulse Width = 100ns, 500kHz, TJ = -10°C to +150°C |tPDLHA – tPDLHB|, |tPDHLA – tPDHLB| |
5 | ns | ||||
tVCCI+ to OUT | VCCI Power-up Delay Time: UVLO Rise to OUTA, OUTB | INA or INB tied to VCCI | 50 | μs | ||
tVDD+ to OUT | VDDA. VDDB Power-up Delay Time: UVLO Rise to OUTA, OUTB | INA or INB tied to VCCI | 10 | μs | ||
|CMH| | High-level common-mode transient immunity (See Section 6.6) | Slew rate of GND versus VSSA/B, INA and INB both are tied to GND or VCCI; VCM = 1500V | 125 | V/ns | ||
|CML| | Low-level common-mode transient immunity (See Section 6.6) | Slew rate of GND versus VSSA/B, INA and INB both are tied to GND or VCCI; VCM = 1500V | 125 | V/ns |