SLUUCH6B september 2022 – september 2023 TPS543B22
Figure 3-1 and Figure 3-2 show the efficiency for both designs on the TPS543B22EVM. The test points listed in Table 3-3 are used for the efficiency measurement. Use these test points to minimize the contribution of PCB parasitic power loss to the measured power loss.
Some additional test setup considerations to minimize external sources of power dissipation are listed below.
RELATED IC | TEST POINT NAME | REFERENCE DESIGNATOR | FUNCTION |
---|---|---|---|
U1 | VIN_P1 | TP30 | Input voltage test point connected near pins of P1 |
VOUT_P1 | TP31 | Output voltage test point near output inductor of P1 | |
PGND_EFF_P1 | TP36, TP33 | PGND reference test point for both input and output voltages Kelvin connected near P1 | |
U2 | VIN_P2 | TP2 | Input voltage test point connected near pins of P2 |
VOUT_P2 | TP1 | Output voltage test point near output inductor of P2 | |
PGND_EFF_P2 | TP9,TP16 | PGND reference test point for both input and output voltages Kelvin connected near P2 |
VOUT = 1.2V | fSW = 2200 kHz |
VOUT = 1 V | fSW = 1000 kHz |