SLVK126C january 2023 – august 2023 TPS7H1111-SP
PRODUCTION DATA
HDR devices were stressed at 3 krad(Si), 10 krad(Si), 30 krad(Si), 50 krad(Si), and 100 krad(Si) for biased and unbiased conditions.
Total Samples: 25 | ||||
Exposure Levels: | ||||
3 krad(Si) (5 samples) | 10 krad(Si) (5 samples) | 30 krad(Si) (5 samples) | 50 krad(Si) (5 samples) | 100 krad(Si) (5 samples) |
Device IDs: 1-5 | Device IDs: 6, 9-12 | Device IDs: 13-17 | Device IDs: 18-22 | Device IDs: 23, 24, 27-29 |
Total Samples: 42 | ||||
Exposure Levels: | ||||
3 krad(Si) (5 samples) | 10 krad(Si) (5 samples) | 30 krad(Si) (5 samples) | 50 krad(Si) (5 samples) | 100 krad(Si) (5 samples) |
Device IDs: 35-39 | Device IDs: 40-44 | Device IDs: 45-49 | Device IDs: 50, 52-55 | Device IDs: 56, 57, 59-61 |
LDR devices were stressed at 3 krad(Si), 10 krad(Si), 30 krad(Si), 50 krad(Si), and 100 krad(Si) for biased and unbiased conditions.
Total Samples: 30 | ||||
Exposure Levels: | ||||
3 krad(Si) (6 samples) | 10 krad(Si) (6 samples) | 30 krad(Si) (6 samples) | 50 krad(Si) (6 samples) | 100 krad(Si) (6 samples) |
Device IDs: 194-199 | Device IDs: 200-205 | Device IDs: 206-209, 212 | Device IDs: 213-218 | Device IDs: 219, 221-224, 226 |
Total Samples: 30 | ||||
Exposure Levels: | ||||
3 krad(Si) (6 samples) | 10 krad(Si) (6 samples) | 30 krad(Si) (6 samples) | 50 krad(Si) (6 samples) | 100 krad(Si) (6 samples) |
Device IDs: 234-236, 238-240 | Device IDs: 241, 242, 246-249 | Device IDs: 250, 253, 255-258 | Device IDs: 259, 263-265, 267, 268 | Device IDs: 269, 271-273, 275, 276 |