SLVK162A
December 2023 – August 2024
TPS7H6003-SP
,
TPS7H6013-SP
,
TPS7H6023-SP
1
Abstract
Trademarks
1
Device Information
1.1
Product Description
1.2
Device Details
2
Neutron Displacement Test Setup
2.1
Test Overview
2.2
Test Facility
2.3
Test Setup Details
3
Test Results
3.1
NDD Characterization Summary
3.2
Data Sheet Electrical Parameters and Associated Tests
4
Applicable and Reference Documents
4.1
Applicable Documents
4.2
Reference Documents
A Appendix: NDD Report Data
B Revision History
4.1
Applicable Documents
Texas Instruments,
TPS7H6003-SP Radiation-Hardness-Assured 200-V, 1.3-A, 2.5-A, Half-Bridge GaN FET Gate Driver
, data sheet.
Texas Instruments,
TPS7H6003EVM-CVAL
, EVM user's guide.
Texas Instruments,
TPS7H6003-SP Single-Event Effects (SEE) Report
, radiation report.