During SEL characterization, the device was heated using a closed-loop PID controlled heat gun [MISTRAL 6 System (120V, 2400W)]. The DUT temperature was monitored prior to being irradiated with a FLIR IR-camera to ensure the junction temperature. The species used for SEL testing was ¹⁶⁵Ho. Incident angle was used which achieved an LET_EFF of 75MeV·cm²/mg.

Three devices were tested under the loopback mode (for more details in loopback mode refer to footnote 1). In the loopback mode (used for DSEE) the overdrive voltage was selected to be 1V. This was done to avoid interpreting a transient as a functional interrupt. All devices were tested in the Waiting to Sequence DOWN state. Maximum recommend voltages were used for V_IN, V_{PULL_UPx} and V_UP. For more configuration information please refer to Table 6-1.

Not a single functional interrupt was observed, neither a high current event on either of the power supplies of the TPS7H3014-SP. A total of three units were tested under the same conditions and configuration. This indicates the TPS7H3014-SP is SEL-free. The results for three runs across three devices are shown in Table 8-3. A typical V_IN current vs time plot during a SEL run is shown in Figure 7-1. Typical V_{PULL_UPx} current vs time plots during SEL runs are shown in Figure 7-2 and Figure 7-3.

Using the MFTF method described in Single-Event Effects (SEE) Confidence Interval Calculations application report and combining (or summing) the fluence of the four runs @ 125°C (4 × 10⁷), the upper-bound cross-section (using a 95% confidence level) is calculated as:

σ_SEL ≤ 1.23 × 10^–7cm²/device for LET_EFF = 75MeV·cm²/mg and T = 125°C.