SLWU087E november   2013  – june 2023

 

  1.   1
  2.   High Speed Data Converter Pro GUI
  3.   Trademarks
  4. 1 Introduction
  5. 2 Software Start up
    1. 2.1 Installation Instructions
    2. 2.2 USB Interface and Drivers
    3. 2.3 Device ini Files
  6. 3 User Interface
    1. 3.1 Toolbar
      1. 3.1.1 File Options
        1. 3.1.1.1 User Profiles
        2. 3.1.1.2 Resize Window
      2. 3.1.2 Instrument Options
        1. 3.1.2.1 TSW14J56 and High Speed Data Converter (HSDC) Pro Eye Quality Analysis
        2. 3.1.2.2 IO Delay
        3. 3.1.2.3 JESD204B Error Injection
        4. 3.1.2.4 FPGA Registers Write Read
      3. 3.1.3 Data Capture Option
        1. 3.1.3.1 Capture Option
        2. 3.1.3.2 Trigger Option
        3. 3.1.3.3 Using Multiple TSW14xxx and ADC EVM’s for Simultaneous Capture using Trigger Option
          1. 3.1.3.3.1 Hardware Setup
          2. 3.1.3.3.2 Setting up the Slave Board
          3. 3.1.3.3.3 Setting up the Master Board
          4. 3.1.3.3.4 Read Captured Memory from the Slave Board
      4. 3.1.4 Test Options
        1. 3.1.4.1  Notch Frequency Bins
        2. 3.1.4.2  2 Channel Display and Cursor Lock
        3. 3.1.4.3  Analysis Window Markers
        4. 3.1.4.4  X-Scale in Time
        5. 3.1.4.5  Y-Scale in Voltage
        6. 3.1.4.6  Other Frequency Options
        7. 3.1.4.7  NSD Marker
        8. 3.1.4.8  Phase Plot
        9. 3.1.4.9  Phase in Degree
        10. 3.1.4.10 Histogram
        11. 3.1.4.11 Disable User Popups
        12. 3.1.4.12 HSDC Pro Lite Version
      5. 3.1.5 Help
    2. 3.2 Status Windows
    3. 3.3 Mode Selection
    4. 3.4 Device Selection
    5. 3.5 Skip Configuration
    6. 3.6 Capture Button (ADC Mode Only)
    7. 3.7 Test Selection (ADC Mode only)
      1. 3.7.1 Single Tone FFT
        1. 3.7.1.1 Parameter Controls
        2. 3.7.1.2 ADC Captured Data Display Pane
        3. 3.7.1.3 FFT Power Spectrum
        4. 3.7.1.4 Overlay Unwrap Waveform
        5. 3.7.1.5 Single Tone FFT Statistics
      2. 3.7.2 Multi Channel Display
      3. 3.7.3 Unit Selection
      4. 3.7.4 Time Domain
      5. 3.7.5 Two Tone
      6. 3.7.6 Channel Power
    8. 3.8 DAC Display Panel (DAC Mode only)
      1. 3.8.1 Send Button (DAC Mode Only)
      2. 3.8.2 Load File to Transfer into TSW14xxx Button
      3. 3.8.3 Parameter Controls
    9. 3.9 I/Q Multi-Tone Generator
  7. 4 ADC Data Capture Software Operation
    1. 4.1 Testing a TSW1400 EVM with an ADS5281 EVM
    2. 4.2 Testing a TSW1400EVM with an ADS62P49EVM (CMOS Interface)
  8. 5 TSW1400 Pattern Generator Operation
    1. 5.1 Testing a TSW1400 EVM with a DAC3152 EVM
    2. 5.2 Loading DAC Firmware
    3. 5.3 Configuring TSW1400 for Pattern Generation
    4. 5.4 Testing a TSW1400 EVM with a DAC5688EVM (CMOS Interface)
  9. 6 TSW14J58 Functional Description
    1. 6.1 Testing the TSW14J58 EVM with an ADC12DJ3200 EVM
  10. 7 TSW14J57 Functional Description
    1. 7.1 Testing the TSW14J57 EVM with an ADC34J45 EVM
  11. 8 TSW14J56 Functional Description
    1. 8.1 Testing the TSW14J56 EVM with an ADC34J45 EVM
  12. 9 TSW14J50 Functional Description
    1. 9.1 Device Selection
  13. 10TSW14J10 Functional Description
    1. 10.1 DAC and ADC GUI Configuration File Changes When Using a Xilinx Development Platform
    2. 10.2 DAC38J84EVM GUI Setup Example
  14.   A Signal Processing in High Speed Data Converter Pro
    1.     A.1 Introduction
    2.     A.2 FFT Calculation from Time Domain Data
      1.      A.2.1 FFT Window Correction Factor
    3.     A.3 FFT Filtering
    4.     A.4 Single Tone Parameters
      1.      A.4.1 Number of Neighboring Bins for each FFT Window
    5.     A.5 Fundamental Power
      1.      A.5.1 Harmonic Distortions
      2.      A.5.2 SNR
      3.      A.5.3 SFDR
      4.      A.5.4 THD
      5.      A.5.5 SINAD
      6.      A.5.6 ENOB
      7.      A.5.7 Next Spur
    6.     A.6 Two Tone Parameters
    7.     A.7 Average FFT Calculation
    8.     A.8 NSD Calculation
  15.   B History Notes
  16.   C Revision History

3.1.2.1 TSW14J56 and High Speed Data Converter (HSDC) Pro Eye Quality Analysis

The TSW14J56EVM uses an Intel PSG® Arria® V GZ FPGA device for the receive and transmit functions for the JESD204B link. One of the features of the Arria® V GZ device is the On-Chip Signal Quality Monitoring Circuitry (EyeQ). The EyeQ feature is a debug and diagnosis tool that analyzes the received data by measuring the horizontal and vertical eye opening.

The following section provides a quick start-up example that highlights the software features of the EyeQ Scan analysis.

  1. Verify that the ADC EVM provides an FFT capture on HSDC Pro.
  2. Under the "Instrument Options" tab, click on "SERDES Test Options".
  3. A new window should appear with the following features:
    • Lane – Selects one of the available lanes for the selected interface mode
    • Time per iteration – Selects how long data is accumulated before generation of the Eye diagram. Increasing this value also increases the Test Time proportionally
    • EQ DC Gain – Adjusts DC gain of FPGA receive hardware block
    • EQ AC Gain – Adjusts AC gain of FPGA receive hardware block
    • Display Standard Eye – Overlays one of the JESD204B receive eye-mask templates onto the Eye diagram
  4. After configuring the parameters, click on "START". The scan may take a few seconds to a few minutes depending on the parameters chosen.

Figure 3-5 shows an eye diagram of the ADC34J45EVM in 442 mode, sampling at 140 MHz and a lane rate of 2.8 GHz.

GUID-20210330-CA0I-MNZS-9MB9-HT6FLPDHS0W0-low.pngFigure 3-5 Example Eye Diagram Plot