3 Results

DUT #4 passed all tests at 100 krad(Si). On DUT #3, one test, VTUNE reset pin voltage, was outside the test limit at 100 krad(Si). This is not a datasheet or SMD test but an internal functional test to ensure optimum calibration of the VCO over temperature. DUT #3 was put through a 48-hour RTA and retested. After the 48-hour RTA, DUT #3 recovered, all tests passed and the VTUNE reset pin voltage returned to a value close to the pre irradiation value. Per TM1019, this wafer is qualified for 100 krad(Si) for application dose rates of 0.57 rad(Si)/s or less.

Over 7000 parameters were tested. Appendix A shows the results, statistics and plots for select representative tests. The first test shown is the VTUNE reset voltage test in which DUT #3 was outside the limit after 100 krad(Si) but recovered after RTA.