SNAK010 April 2022 ADC128S102-SEP
The ADC128S102PW-SEP HDR exposure was performed on biased devices in a Co-60 gamma cell at the TI SVC facility in Santa Clara, California. After exposure, the devices were tested post radiation for full electrical evaluation using Texas Instruments ATE. A minimum of 22 units are required to qualify a full wafer lot, a total sample size of 24 units (22 RLAT and two control units) were tested.