LMX1906-SP (5962R2320201PXE) wafer lot 2013693 was put through radiation lot acceptance testing (RLAT) and passed at 100 krad(Si). The wafer fab process used by this product was previously shown not to exhibit Enhanced Low Dose Rate Sensitivity (ELDRS) and is ELDRS-free.
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The LMX1906-SP (5962R2320201PXE)(1) uses the BC13 wafer fab process which has been shown not to exhibit Enhanced Low Dose Rate Sensitivity (ELDRS)(2). Per MIL-STD-883 Test Method 1019(3), if a BiCMOS product is on a process that is shown to be ELDRS-free, Total Ionizing Dose (TID) Radiation Lot Acceptance Testing (RLAT) can be performed at high dose rate (HDR). In the case of BC13, HDR testing is the worst-case condition and covers low dose rate (LDR) applications.
For RLAT of a wafer lot, the sample size is five units per MIL-PRF-38535 (4).