SNAK022 May   2024 LMX1860-SEP

 

  1.   1
  2.   LMX1860-SEP Single-Event Effects Test Report
  3.   Trademarks
  4. 1Product Description
  5. 2Test Setup
    1. 2.1 SEL Test
    2. 2.2 SEFI Test
    3. 2.3 Test Facility
  6. 3Results
    1. 3.1 SEL Results
    2. 3.2 SEFI Results
  7. 4Summary
  8. 5References

Abstract

The LMX860-SEP was tested under heavy ions and monitored for Single-Event Latchup (SEL) and Single-Event Functional Interrupt (SEFI). No incidences of SEL or SEFI were detected at an effective linear energy transfer (LETeff) greater than 43MeV-cm2/ mg with a fluence of 1 × 107 ions / cm2. SEL testing was performed at maximum operating temperature and voltage. Single-Event Upsets (SEU) of the outputs were detected but not characterized. The SEP family of devices are radiation tested products for space missions with reduced radiation and reliability requirements.