SNLA132G October   2011  – November 2020 DS90UB928Q-Q1 , DS90UB941AS-Q1 , DS90UB948-Q1 , DS90UH925Q-Q1 , DS90UH926Q-Q1 , DS90UH940N-Q1

 

  1.   Trademarks
  2. 1Introduction
  3. 2Overview of Internal Test Pattern Generation
    1. 2.1 Color Mode
    2. 2.2 Video Timing Modes
    3. 2.3 Clock Generation
    4. 2.4 Pattern Selection
    5. 2.5 Pattern Inversion
    6. 2.6 Auto-Scrolling
  4. 3Serial Control Bus Registers for Internal Test Pattern Generation
    1. 3.1 Direct Register Map
      1. 3.1.1 Control and Configuration
      2. 3.1.2 Indirect Access Address and Data
      3. 3.1.3 DS90Ux928Q-Q1/DS90UB924-Q1 Internal Clock Source
    2. 3.2 Indirect Register Map
      1. 3.2.1 General Control
      2. 3.2.2 Internal Timing Control
      3. 3.2.3 Auto-Scrolling Control
  5. 4Configuration Examples
    1. 4.1 Auto-Scrolling Configuration
    2. 4.2 Internal Default Timing Configuration
    3. 4.3 Custom Display Configuration
    4. 4.4 1080p60 with External Clock Example Configuration
    5. 4.5 Resolution Readback Example
  6. 5Conclusion
  7. 6References
  8. 7Revision History

3 Serial Control Bus Registers for Internal Test Pattern Generation

The Internal Test Pattern generator is configured and enabled from the internal control registers, accessible locally through the I2C control interface, or remotely via the FPD-Link III Bidirectional Control Channel. The Pattern Generator control registers consist of both a Direct Register Map, as well as an Indirect Register Map, the latter of which is accessible through an indirect address pointer/data mechanism.