SNOU176B October 2020 – March 2022
PRODUCTION DATA
Key test points on this EVM are designed for oscilloscope probes with short ground springs. Using short ground springs instead of alligator ground leads will minimize measurement error and produce a cleaner signal with the fast switching GaN devices used on this EVM. The data in this user guide uses this measurement method.
NAME | DESCRIPTION |
---|---|
VAUX | 12-V bias input connection before filter |
ACMGND | Ground for 12-V bias input before filter |
5V | 5-V bias |
AGND1 | Analog ground for logic |
PWM | Single input PWM signal |
LDEAD1 | Low-side PWM signal before dead time generation |
AGND3 | Analog ground for logic |
HDEAD1 | High-side PWM signal before dead time generation |
AGND4 | Analog ground for logic |
LOW | Low-side PWM signal with dead time |
HIGH | High-side PWM signal with dead time |
AGND2 | Analog ground for logic |
12V | 12-V bias after filter |
PGND1 | Power ground |
HVIN | DC input voltage |
PGND2 | Power ground |
HVOUT | DC output voltage |
PGND3 | Power ground |
SW1 | Switch node voltage |
For this EVM version, not all the test points are available on the motherboard due to the size of the daughter card. To probe the switching node, TI recommends using a pigtail on the daughter card on PGND pin. A probe could use the PGND pigtail and SW test point on the daughter card to complete the measurement.