SNOU206 October   2024 LMG2640

 

  1.   1
  2.   Description
  3.   Features
  4.   Applications
  5.   5
  6. 1Evaluation Module Overview
    1. 1.1 Introduction
    2. 1.2 Kit Contents
    3. 1.3 Specification
    4. 1.4 Device Information
    5. 1.5 General TI High Voltage Evaluation User Safety Guidelines
      1. 1.5.1 Safety and Precautions
  7. 2Hardware
    1. 2.1 LMG2640EVM-090 Daughter Card
      1. 2.1.1 Test Points
      2. 2.1.2 Integrated Current Sensing
      3. 2.1.3 Enable Pin
      4. 2.1.4 FAULT
      5. 2.1.5 Power Pins
      6. 2.1.6 Heat Sink
    2. 2.2 Motherboard
      1. 2.2.1 Bias Supply
      2. 2.2.2 PWM Input
      3. 2.2.3 Fault Protection
    3. 2.3 Recommended Footprint
    4. 2.4 Test Equipment
    5. 2.5 Test Procedure When Paired With LMG342X-BB-EVM
      1. 2.5.1 Setup
      2. 2.5.2 Start-Up and Operating Procedure
      3. 2.5.3 Test Results
      4. 2.5.4 Shutdown Procedure
      5. 2.5.5 Additional Operating Notes
  8. 3Hardware Design Files
    1. 3.1 LMG2640EVM-090 Schematic
    2. 3.2 Motherboard Schematic
    3. 3.3 PCB Layout
    4. 3.4 Bill of Materials
  9. 4Additional Information
    1. 4.1 Trademarks
  10. 5Related Documentation

2.1.4 FAULT

The LMG2640EVM-090 only reports a low-side overtemperature fault. A low-side overtemperature fault is reported on the FLT pin when the low-side overtemperature protection function is asserted. The FLT pin is an active low open-drain output so the pin pulls low when there is a low-side overtemperature fault. Refer to the LMG2640 Integrated 650V GaN Half Bridge data sheet for operation details.