4 Diagnostic Libraries for UL/IEC 60730-1/60335-1 Provided by C2000™

The requirements for safety standards are almost uniform, but the understanding and requirements of various certification agencies are different. Therefore, TI provides a mature diagnostic library for the MCU section in the standards, so that engineers can make library calls according to the specific requirements of the agency. To meet the testing requirements of IEC/UL 60730-1/60335-1, a round of self-test is usually performed after power-on or reset, and periodic self-tests are performed after the application program is functioning properly. Figure 4-1 shows the commonly-used self-test software structure.

Figure 4-1 Commonly Used Self-Test Software Structure

After power-on, when the MCU initialization is completed, a round of self-test is performed, including Stack Overflow Detection, watchdog test, CPU and FPU registers test, PC test, Clock test, RAM test (March13N), Flash test (CRC or ECC), ADC test, and so on. After the system functions are running, periodic self-tests are performed. The main difference between power-on detection and periodic cycle detection is in the stack and watchdog. Stack overflow detection is hardware-triggered and can be configured in the power-on detection. Watchdog detection only needs to be performed once during power-on detection because the watchdog is fed periodically while the program is running.

TI's C2000ware SDK provides the software diagnostic libraries related to the self-test of the previously-mentioned MCU. Taking F280013x as an example, the code can be found in C2000Ware_x_0x_00_00\libraries\diagnostic\f280013x and the example project is in f280013x \examples\test_application. To help engineers better understand the principles and methods of C2000 MCU self-test, and to facilitate the application of the required source code to the system project, and also for communication and confirmation with security certification agencies, detailed introductions follow for each self-test item.