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  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
  5. 2Overview of C2000™ MCU Devices in Appliances
  6. 3Introduction of IEC/UL 60730-1/60335-1 Standards
  7. 4Diagnostic Libraries for UL/IEC 60730-1/60335-1 Provided by C2000™
    1. 4.1 Stack Overflow Detection
    2. 4.2 Watchdog
    3. 4.3 CPU and FPU Registers
    4. 4.4 Program Counter (PC)
    5. 4.5 Clock
    6. 4.6 RAM
    7. 4.7 Flash
    8. 4.8 ADC
    9. 4.9 Cycle Time and Memory Usage
  8. 5References

4.9 Cycle Time and Memory Usage

Table 4-1 lists the main self-test items, and the memory usage, and execution cycles of the corresponding functions.

Table 4-1 Cycle Time and Memory Usage
Item API Memory
(16-bit words)		 PASS Cycles
(RAM)

CPU

STL_CPU_REG_testCPURegisters

205

652

FPU

STL_CPU_REG_testFPURegisters

106

287

CLOCK

STL_OSC_CT_startTest & STL_OSC_CT_stopTest

96

145

RAM

STL_March_testRAMCopy (16 words)

47

501

FLASH(CRC)

STL_CRC_checkCRC (32 words)

36

234

FLASH(ECC)

RunECCErrorTest

67

276

Among them, the RAM and Flash (CRC) only list the pass cycles of 16 words and 32 words. Complete RAM and Flash (CRC) tests need to consider the total testing memory space and the self-test execution cycle. Flash (ECC) only needs to be executed once in a round of self-test, which is why Flash (ECC) can significantly reduce the CPU usage of the self-test function.