Instantiated in MAIN domain are
different internal diagnostics modules which provide monitoring and diagnostic
functions required to achieve certain safety compliance levels:
- Six
Dual Clock Comparator (DCC) modules, used to determine the accuracy of a
clock signal during the time execution of an application, each having the
following main features:
- Two independent
counter blocks count clock pulses from each clock source
- Each counter block is
programmable, however, for proper operation the counters must be
programmed with seed values that respect the ratio of the two clock
frequencies
- Configurable time
base for error signal
- Error signal
generation when one of the clocks is out of spec
- Clock frequency
measurement
- One instance of Error
Signaling Module (ESM) for safety-related events and/or errors aggregation
from throughout the device into one location supports the following main
features:
- Up to 1024 level or
pulse error event inputs
- Selectable low and
high priority interrupt error pin prioritization of each error
event
- Error
signal routed out of device through MCU_ESM error
signal
- Configurable time
base for error signal
- Error forcing
capability
- Internal redundant
flops on safety critical fields
- Multiple ECC aggregator
modules supporting ECC mechanism for providing increased system reliability
via reduction of memory software errors by allowing single bit errors to be
detected and corrected (SEC) and double bit errors to be detected (DED).
Applied to different memories in many of the subsystems, each of the ECC
aggregators has the following main features:
- Reduces memory
software errors via single error correction (SEC) and double error
detection (DED)
- Provides a mechanism
to control and monitor the ECC RAMs in a module or subsystem
- Supports software
readable status of ECC errors (single and double-bit) and associated
info such as RAM address and data bit or bits that are in error
- Aggregates level
pending status from the ECC RAMs in two interrupts to the device CPU
– interrupt for correctable error (SEC) and interrupt for
uncorrectable error (DED)
- Supports up to 256
ECC endpoints (either ECC RAM or interconnect ECC component)
- Single bit error
detection via parity checking results in a non-correctable error
interrupt