This section provides a brief description of the
test algorithm used for memory self-test.
- March13N:
- March13N is the baseline
test algorithm for SRAM testing. It provides the highest overall
coverage.
- The concept behind the
general march algorithm is to indicate:
- The bit cell can
be written and read as both a 1 and a 0.
- The bits around
the bit cell do not affect the bit cell.
- The basic operation of
the march is to initialize the array to a know pattern, then march a
different pattern through the memory.
- Type of faults detected
by this algorithm:
- Address decoder
faults
- Stuck-At
faults
- Coupled
faults
- State coupling
faults
- Parametric
faults
- Write recovery
faults
- Read/write logic
faults