TIDT316
December
2022
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Description
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Features
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Applications
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1Test Prerequisites
- 1.1
Voltage and Current Requirements
- 1.2
Considerations
- 1.3
Dimensions
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2Testing and Results
- 2.1
Efficiency Graph
- 2.2
Loss Graph
- 2.3
Load Regulation
- 2.4
Line Regulation
- 2.5
Thermal Images
- 2.5.1
8-V Input Voltage
- 2.5.2
12-V Input Voltage
- 2.5.3
18-V Input Voltage
- 2.5.4
Conclusion
- 2.6
Bode Plots
- 2.6.1
5.2-V Input Voltage (Board Input, 5.0 V at
Power Stage)
- 2.6.2
12-V Input Voltage
- 2.6.3
18-V Input Voltage
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3Waveforms
- 3.1
Switching
- 3.1.1
Switchnode (SW) to GND
- 3.1.1.1
8-V Input Voltage
- 3.1.1.2
12-V Input Voltage
- 3.1.1.3
18-V Input Voltage
- 3.1.2
Diode D1 (Referenced to
VOUT)
- 3.1.2.1
8-V Input Voltage
- 3.1.2.2
12-V Input Voltage
- 3.1.2.3
18-V Input Voltage
- 3.2
Output Voltage Ripple
- 3.3
Input Voltage Ripple (AC-Coupled)
- 3.3.1
Board Input
- 3.3.2
Power Stage Input
- 3.4
Load Transients
- 3.4.1
8-V Input Voltage
- 3.4.2
12-V Input Voltage
- 3.4.3
18-V Input Voltage
- 3.5
Start-Up Sequence
- 3.5.1
8-V Input Voltage
- 3.5.2
12-V Input Voltage
- 3.5.3
18-V Input Voltage
- 3.6
Shutdown Sequence
- 3.6.1
8-V Input Voltage
- 3.6.2
12-V Input Voltage
- 3.6.3
18-V Input Voltage
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A Output Ripple Reduction, Output Current
Capability, and Dithering Option
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A.1 Output Ripple Reduction by Adding Ceramic
Output Capacitors (MLCCs)
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A.1.1 Initial Design
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A.1.2 Adding one 47-µF X7R Ceramic Capacitor,
MLCC, 10 V, X7R, 1210
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A.1.3 Adding a Second 47-µF Capacitor (Final
Design)
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A.2 Maximum Output Current Capability at
Ultra-Low Cold Cranking Using LM5157
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A.3 Dithering Option via Resistor R10
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A.3.1 Enabled
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A.3.2 Disabled
Features
- 6-V bias supply for automotive applications and
general purposes, steps up and steps down
- Cost-effective with a single
driver, single FET, and single rectifier
- High integration due to powerful
internal FET
- Provides input filter to prevent
FM band noise
- Supports ultra-low cold-cranking
as low as 1.5-V input voltage by ORing diodes
- This reference design is
completely built and has completed testing in a lab