TIDUEZ0A March 2021 – March 2022 TMS320F28P550SJ , TMS320F28P559SJ-Q1
In this test condition, the system is configured to operate in an open loop and close-loop control mode, generating a static 50-Hz output. The power demand is then modulated by the resistive bank, together with the MCU, to test the system at multiple load points. This operation allows the user to do preliminary testing before going at high voltage and high power operation.