The purpose of this study was to characterize the effects of heavy-ion irradiation on the single-event latchup (SEL) performance of the INA901-SP, 65V, low-high-side, high-speed, voltage output current sense amplifier. Heavy ions with an LETEFF of 76 to 93MeV-cm2/ mg were used to irradiate one device with a fluence of 1 × 107 ions / cm2. The results demonstrate that the INA901-SP is SEL-free up to LETEFF = 93MeV-cm2 / mg at 125°C.
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The INA901-SP device is a radiation-hardened, voltage-output, current-sense amplifier that can sense drops across shunt resistors at common-mode voltages from –15V to 65V, independent of supply voltage. The INA901-SP pinouts readily enable filtering.
Table 1-1 lists general device information and test conditions. For more detailed technical specifications and links to related documentation, see the INA901-SP Radiation Hardened, –15-V to 65-V Common Mode, Unidirectional Current-Shunt Monitor data sheet
| Description(1) | Device Information |
|---|---|
| TI Part Number | INA901-SP |
| SMD Number | 5962-1821001VXC |
| Device Function | Current Sense Amplifier |
| Technology | LBC-S0I |
| Exposure Facility | Radiation Effects Facility, Cyclotron Institute, Texas A&M University |
| Heavy Ion Fluence per Run | 1 × 107 ions / cm2 |
| Irradiation Temperature | 125°C |
