This report presents the reliability and qualification results for the LMX2694-EP device: a high-performance, wideband phase-locked loop (PLL) with an integrated voltage-controlled oscillator (VCO) and voltage regulators. The LMX2694-EP is manufactured with a controlled baseline and contains the following:
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TI qualification testing is a risk mitigation process that is engineered to assure device longevity in customer applications. Wafer fabrication process and package level reliability are evaluated in a variety of ways that may include accelerated environmental test conditions with subsequent derating to actual use conditions. Manufacturability of the device is evaluated to verify a robust assembly flow and assure continuity of supply to customers, TI Enhanced Products are qualified with industry standard test methodologies performed to the intent of Joint Electron Devices Engineering Council (JEDEC) standards and procedures. Texas Instruments Enhanced Products are certified to meet GEIA-STD-0002-1 Aerospace Qualified Electronic Components.