DLPU018J October 2014 – June 2024 DLPC900
When the internal test pattern is the selected input, the Internal Test Pattern Select defines the test pattern displayed on the screen. These test patterns are internally generated; therefore, all image processing is performed on the test images. The resolution of the Test Pattern is native to the attached DMD.
I2C | USB | |
---|---|---|
Read | Write | 0x1203 |
0x0A | 0x8A |
BYTE | BITS | DESCRIPTION | RESET | TYPE |
---|---|---|---|---|
0 | 3:0 | Internal Test Patterns Select: | d10 | wr |
0 = Solid field | ||||
1 = Horizontal ramp | ||||
2 = Vertical ramp | ||||
3 = Horizontal lines | ||||
4 = Diagonal lines | ||||
5 = Vertical lines | ||||
6 = Grid | ||||
7 = Checkerboard | ||||
8 = RGB ramp | ||||
9 = Color bars | ||||
10 = No pattern | ||||
11 - 15 = Reserved | ||||
7:4 | Reserved |