DLPU094 July   2020 DLP5530S-Q1

 

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5.2 DLP5530S-Q1 Chipset Functional Safety Concept

Typical applications for the DLP5530S-Q1 chipset include a HUD and Windshield Cluster. This section discusses some typical hazards in these applications and how this chipset can help minimize the risk of these hazards.

For risk minimization, this chipset includes many Built-In Self Tests (BISTs). These are monitoring and diagnostic functions that are implemented in the chipset to detect and act upon failure conditions. A general overview of BISTs with regards to typical hazards is provided below. For full implementation details, please refer to the DLPC230S-Q1 Programmer's Guide for Display Applications.