SBAK019
May 2024
ADC3683-SP
1
2
Trademarks
1
Introduction
2
Single-Event Effects
3
Device and Test Board Information
4
Irradiation Facility and Setup
5
Depth, Range, and LETEFF Calculation
6
Test Setup and Procedures
7
Destructive Single-Event Effects (DSEE)
7.1
Single-Event Latch-Up (SEL) Results
8
Single-Event Transients (SET)
8.1
Single Event Transients
9
Event Rate Calculations
10
Summary
11
References
8
Single-Event Transients (SET)