SBAS876C August 2018 – June 2019 ADS9224R , ADS9234R
PRODUCTION DATA.
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
CONVERSION CONTROL AND DATA TRANSFER (See Figure 1 and Figure 2) | ||||||
tDRDY | Data ready time for present sample: CONVST high to READY high | Zero cycle latency (zone 1 transfer) for ADS9224R | 315 | ns | ||
Data ready time for present sample: CONVST high to READY high | Zero cycle latency (zone 1 transfer) for ADS9234R | 280 | ns | |||
SPI-COMPATIBLE AND PARALLEL BYTE PROTOCOL (See Figure 3) | ||||||
tDEN_CSDO | Delay time: CS falling to data valid on SDO-x | 12 | ns | |||
tDZ_CSDO | Delay time: CS rising edge to SDO-x tristate | 12 | ns | |||
tD_CKDO | Delay time: SCLK launch edge to next data valid on SDO-x | SPI-compatible protocols with single data rate | 15.8 | ns | ||
tD_CKDO | Delay time: SCLK launch edge to next data valid on SDO-x | SPI-compatible protocols with double data rate | 21 | ns | ||
tD_CKDO | Delay time: SCLK launch edge to next data valid on SDO-x | Parallel byte protocol | 21 | ns | ||
tA | Aperture delay | 8 | ns | |||
tA mismatch | 40 | ps | ||||
tJITTER | Aperture jitter | 2 | ps | |||
CLOCK RE-TIMER PROTOCOL WITH STROBE = SCLK (EXTERNAL CLOCK)(1)(See Figure 4) | ||||||
tOFF_STROBE_DO | Time offset: STROBE edge to next data valid on SDO-x | -2.5 | 2.5 | ns | ||
tD_CS_READY | Delay time: CS rising to READY displaying internal device state | 13.5 | ns | |||
tD_CKSTROBE_r | Delay time: SCLK rising edge to STROBE rising | 21.5 | ns | |||
tD_CKSTROBE_f | Delay time: SCLK falling edge to STROBE falling | 21.5 | ns | |||
tPH_STROBE | Strobe output high time | 0.45 × tSTR | 0.55 × tSTR | ns | ||
tPL_STROBE | Strobe output low time | 0.45 × tSTR | 0.55 × tSTR | ns | ||
CLOCK RE-TIMER PROTOCOL WITH STROBE = INTERNAL CLOCK (1)(See Figure 5) | ||||||
tD_CS_STROBE | Delay time : CS falling to 1st STROBE rising | 15 | 50 | ns | ||
tOFF_STROBE_DO | Time offset : STROBE edge to next data valid on SDO-x | -2.5 | 2.5 | ns | ||
tD_CS_READY | Delay time: CS rising to READY displaying internal device state | 13.5 | ns | |||
tINTCLK | INTCLK period | 15 | ns | |||
tSTR | STROBE period | INTCLK | 16 | ns | ||
INTCLK / 2 | 30 | ns | ||||
INTCLK / 4 | 60 | ns | ||||
tWH_STR | STROBE high period | 0.45 × tSTR | 0.55 × tSTR | ns | ||
tWL_STR | STROBE low period | 0.45 × tSTR | 0.55 × tSTR | ns | ||
ASYNCHRONOUS RESET AND POWER-DOWN TIMING (See Figure 6) | ||||||
tRST-WKUP | Wake up time from reset | 1 | µs | |||
tPD-WKUP(1) | Wake up time from power-down | 18 | 150 | ms | ||
tWKUP-REFOUT | REFOUT wake-up time | 15.6 | 140 | ms | ||
tREFP_x-SETTLE | Reference buffer output settling time | CREFP_x = 10µF | 18 | 150 | ms |