SBASAU9 October 2024 ADC3908D025 , ADC3908D065 , ADC3908D125 , ADC3908S025 , ADC3908S065 , ADC3908S125
PRODUCTION DATA
The ADC3908Dx and ADC3908Sx has a static test pattern that can be enabled via pin control (see Interface Configuration Table). The test pattern splits each channel data into two groups, upper (D7:D4) and lower (D3:D0) bits. Each group has a value of all zeros or a value of all 1s. Figure 7-7 shows how test pattern is implemented for dual channel. Figure 7-8 shows how test pattern is implemented for single channel.