SBAU407 april   2023 ADS8354

 

  1.   Abstract
  2.   Trademarks
  3. 1Overview
    1. 1.1 ADS8354EVM-PDK Features
    2. 1.2 ADS8354EVM Features
    3. 1.3 Related Documentation From Texas Instruments
  4. 2Analog Interface
    1. 2.1 Connectors for Analog Inputs
    2. 2.2 ADC Input Signal Driver
      1. 2.2.1 Input Signal Path
  5. 3Digital Interfaces
    1. 3.1 SPI for the ADC Digital I/O
  6. 4Power Supplies
    1. 4.1 ADC Input Driver Configuration
    2. 4.2 ADC Voltage Reference Configuration
  7. 5ADS8354EVM-PDK Initial Setup
    1. 5.1 Default Jumper Settings
    2. 5.2 EVM Graphical User Interface Software Installation
  8. 6ADS8354EVM-PDK Operation
    1. 6.1 EVM GUI Global Settings for ADC Control
    2. 6.2 Time Domain Display Tool
    3. 6.3 Spectral Analysis Tool
    4. 6.4 Histogram Analysis Tool
  9. 7Bill of Materials, Printed-Circuit Board Layout, and Schematics
    1. 7.1 Bill of Materials
    2. 7.2 PCB Layout
    3. 7.3 Schematics

Histogram Analysis Tool

The Histogram Analysis tool can be used to estimate the effective resolution of the ADC resulting from performance degradation caused by noise. Effective resolution is an indicator of the number of bits of ADC measurement resolution resulting from performance losses caused by noise generated by the various sources connected to the ADC when measuring a DC signal. The cumulative effect of noise coupling to the ADC output (from sources such as the input drive circuits, the reference drive circuit, the ADC power supply, and the ADC) is reflected in the standard deviation of the ADC output code histogram obtained by performing multiple conversions of a DC input applied to a given channel.

The histogram corresponding to a DC input is displayed by clicking the Capture button. The example capture shown in Figure 6-6 is captured with the EVM configured by remove jumpers from pin 1 and 2 of jumper JP5 and JP6, shorting pin [1-2] of JP1, JP2, JP3, and JP4 using 100-mil jumpers.

GUID-20230223-SS0I-ZHLG-X0W6-SXQGD9BRWV52-low.svgFigure 6-6 Histogram Analysis Tool