SBOA387A March   2020  – April 2022 INA186-Q1

 

  1. 1Overview
  2. 2Functional Safety Failure In Time (FIT) Rates
    1. 2.1 DCK-6 Package
    2. 2.2 DBV-5 Package
    3. 2.3 DDF-8 Package
  3. 3Failure Mode Distribution (FMD)
  4. 4Pin Failure Mode Analysis (Pin FMA)
    1. 4.1 DCK-6 Package
    2. 4.2 DBV-5 Package
    3. 4.3 DDF-8 Package
  5. 5Revision History

1 Overview

This document contains information for INA186-Q1 (DCK-6, DBV-5, and DDF-8 packages) to aid in a functional safety system design. Information provided are:

  • Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
  • Component failure modes and their distribution (FMD) based on the primary function of the device
  • Pin failure mode analysis (Pin FMA)

Figure 1-1 shows the device functional block diagram for reference.

GUID-694BAC7C-8EAD-4E49-BD34-57DCAA5C538A-low.gif Figure 1-1 Functional Block Diagram

INA186-Q1 was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.