SBOA413 September 2020 – MONTH TLV2314-Q1
The failure mode distribution estimation for TLV2314-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
|
Out open (HIZ) |
20% |
| Out saturate high | 25% |
|
Out saturate low |
25% |
| Out functional not in specification or timing | 30% |