SBOA417 July   2020  – MONTH  TLV2372-Q1

 

  1.   Trademarks
  2. 1Overview
  3. 2Functional Safety Failure In Time (FIT) Rates
  4. 3Failure Mode Distribution (FMD)
  5. 4Revision History

Overview

This document contains information for TLV2372-Q1 (SOIC package) to aid in a functional safety system design. Information provided are:

  • Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
  • Component failure modes and their distribution (FMD) based on the primary function of the device

Figure 1-1 shows the device functional block diagram for reference.

GUID-AA8839E9-B025-4449-B7FA-A470498F9048-low.gifFigure 1-1 Functional Block Diagram