SBOA446 March 2021 TLV9002-Q1 , TLV9004-Q1
This section provides Functional Safety Failure In Time (FIT) rates for the SOIC (8) package of TLV9002-Q1 based on two different industry-wide used reliability standards:
FIT IEC TR 62380 / ISO 26262 | FIT (Failures Per 109 Hours) |
---|---|
Total Component FIT Rate | 11 |
Die FIT Rate | 3 |
Package FIT Rate | 8 |
The failure rate and mission profile information in Table 2-1 comes from the Reliability data handbook IEC TR 62380 / ISO 26262 part 11:
Table | Category | Reference FIT Rate | Reference Virtual TJ |
---|---|---|---|
4 | BICMOS Op Amp, Comparators |
8 FIT | 45°C |
The Reference FIT Rate and Reference Virtual TJ (junction temperature) in Table 2-2 come from the Siemens Norm SN 29500-2 tables 1 through 5. Failure rates under operating conditions are calculated from the reference failure rate and virtual junction temperature using conversion information in SN 29500-2 section 4.