SBOA564A December   2022  – August 2024 TRF0206-SP

 

  1.   1
  2.   Single-Event Effects Test Report of the TRF0206-SP 6.5-GHz Differential Amplifier
  3.   Trademarks
  4. 1 Overview
  5. 2 Single-Event Effects
  6. 3 Test Device and Evaluation Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Depth, Range, and LETEFF Calculation
  9. 6 Test Set-Up and Procedures
  10. 7 Single-Event Latch-up (SEL) Results
  11. 8 Single-Event Transients (SET) Results
  12. 9 Event Rate Calculations
  13. 10Summary
  14.   A Total Ionizing Dose from SEE Experiments
  15.   B Confidence Interval Calculations
  16.   C Orbital Environment Estimations
  17.   D References
  18.   E Revision History

3 Test Device and Evaluation Board Information

The TRF0206-SP is packaged in a 12-pin, thermally-enhanced, leadless ceramic chip carrier package (LCCC) as shown in Figure 3-1. The TRF0206-SP Radiation Board was used to evaluate the single-events-effects (SEE) of the TRF0206-SP. Top view of the evaluation board used for the radiation testing are shown in Figure 3-1. Schematic of the evaluation board used for radiation testing is shown in Figure 3-2. For more technical information about the TRF0206-SP, see https://www.ti.com/product/TRF0206-SP/technicaldocuments.

TRF0206-SP TRF0206-SP Radiation BoardFigure 3-1 TRF0206-SP Radiation Board
TRF0206-SP TRF0206-SP Radiation board Schematic for SEE TestingFigure 3-2 TRF0206-SP Radiation board Schematic for SEE Testing