The purpose of this study was to characterize the effects of heavy-ion irradiation on the single-event effect (SEE) performance of the TMP461-SP Remote and Local Digital Temperature Sensor. Heavy ions with an LETEFF of 76 MeV-cm2/mg were used to irradiate the devices with a fluence of 1 × 107 ions/cm2. The results demonstrate that the TMP461-SP is SEL-free up to LETEFF = 76.18 MeV-cm2/mg at 125°C, and dynamic SET cross section is presented.
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The TMP461-SP device is a radiation-hardened, high-accuracy, low-power remote temperature sensor monitor with a built-in local temperature sensor. The remote temperature sensors are typically low-cost discrete NPN or PNP transistors, or substrate thermal transistors or diodes that are integral parts of microprocessors, analog-to-digital converters (ADC), digital-to-analog converters (DAC), microcontrollers, or field-programmable gate arrays (FPGA). Temperature is represented as a 12-bit digital code for both local and remote sensors, giving a resolution of 0.0625°C. The two-wire serial interface accepts the SMBus communication protocol with up to nine different pin-programmable addresses.
Table 1-1 lists general device information and test conditions. For more detailed technical specifications, user-guides, and application notes, see http://www.ti.com/product/TMP461-SP/technicaldocuments.
DESCRIPTION | DEVICE INFORMATION(1) |
---|---|
TI Part Number | TMP461-SP |
SMD Number | 5962-1721801VXC |
Device Function | Remote and Local Digital Temperature Sensor |
Technology | LBC8LV |
Exposure Facility | Radiation Effects Facility, Cyclotron Institute, Texas A&M University |
Heavy Ion Fluence per Run | 1 × 106 – 1 × 107 ions/cm2 |
Irradiation Temperature | 25°C and 125°C (for SEL Testing) |